Demonstration of citation pattern analysis for plagiarism detection
2013 | conference paper
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Cite this publication
Demonstration of citation pattern analysis for plagiarism detection
Gipp, B. ; Meuschke, N.; Breitinger, C.; Lipinski, M. & Nürnberger, A. (2013)
In:Jones, Gareth J. F.; Sheridan, Páraic; Kelly, Diane; de Rijke, Maarten; Sakai, Tetsuya (Eds.), Proceedings pp. 1119-1120. SIGIR '13: The 36th International ACM SIGIR conference on research and development in Information Retrieval, Dublin, Ireland.
ACM Digital Library. DOI: https://doi.org/10.1145/2484028.2484214
Documents & Media
Details
- Authors
- Gipp, Bela ; Meuschke, Norman; Breitinger, Corinna; Lipinski, Mario; Nürnberger, Andreas
- Editors
- Jones, Gareth J. F.; Sheridan, Páraic; Kelly, Diane; de Rijke, Maarten; Sakai, Tetsuya
- Issue Date
- 2013
- Publisher
- ACM Digital Library
- Conference
- SIGIR '13: The 36th International ACM SIGIR conference on research and development in Information Retrieval
- ISBN
- 978-1-4503-2034-4
- Conference Place
- Dublin, Ireland
- Event start
- 2013-07-28
- Event end
- 2013-08-01
