Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment
1995-04-14 | journal article; research paper. A publication with affiliation to the University of Göttingen.
Jump to: Cite & Linked | Documents & Media | Details | Version history
Documents & Media
Details
- Authors
- Salditt, Tim ; Metzger, Till Hartmut ; Peisl, J.; Goerigk, G.
- Abstract
- We present measurements of non-specular x-ray scattering from rough interfaces at a dedicated small-angle scattering beamline that allows for very low divergence of the incident beam and therefore for high resolution close to the specularly reflected beam. A two-dimensional detector is used to measure the non-specular intensity both in and out of the plane of reflection. The method is exemplified by an Au single layer, an amorphous Nb/Al2O3 multilayer and an epitaxial GaAs/AlAs superlattice sample.
- Issue Date
- 14-April-1995
- Journal
- Journal of Physics D: Applied Physics
- Organization
- Institut für Röntgenphysik
- Working Group
- RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)
- ISSN
- 0022-3727
- Language
- English
- Subject(s)
- x-ray scattering; membrane biophysics
