Recent advances in use of atomic layer deposition and focused ion beams for fabrication of Fresnel zone plates for hard x-rays
2013-09-26 | conference paper. A publication with affiliation to the University of Göttingen.
Jump to: Cite & Linked | Documents & Media | Details | Version history
Cite this publication
Recent advances in use of atomic layer deposition and focused ion beams for fabrication of Fresnel zone plates for hard x-rays
Keskinbora, K.; Robisch, A.-L. ; Mayer, M.; Grévent, C.; Szeghalmi, A. V.; Knez, M. & Weigand, M. et al. (2013)
X-ray nanoimaging: instruments and methods; 28 - 29 August 2013, San Diego, California, United States. SPIE X-Ray Nanoimaging Conference, San Diego, Calif..
Bellingham, Wash.: SPIE. DOI: https://doi.org/10.1117/12.2027251
Documents & Media
Details
- Authors
- Keskinbora, Kahraman; Robisch, Anna-Lena ; Mayer, Marcel; Grévent, Corinne; Szeghalmi, Adriana V.; Knez, Mato; Weigand, Markus; Snigireva, Irina; Snigirev, Anatoly; Salditt, Tim ; Schütz, Gisela
- Issue Date
- 26-September-2013
- Publisher
- SPIE
- Organization
- Institut für Röntgenphysik
- Working Group
- RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)
- Conference
- SPIE X-Ray Nanoimaging Conference
- ISBN
- 978-0-8194-9701-7
- Conference Place
- San Diego, Calif.
- Event start
- 2013-08-28
- Event end
- 2013-08-29
- Language
- English
- Subject(s)
- x-ray optics
