Near-edge X-ray absorption fine structure measurements using a laser plasma XUV source
2009-09-25 | conference paper; research paper. A publication with affiliation to the University of Göttingen.
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Near-edge X-ray absorption fine structure measurements using a laser plasma XUV source
Peth, C.; Barkusky, F.; Sedlmair, J.; Gleber, S.-C. ; Nováková, E.; Niemeyer, J. & Thieme, J. et al. (2009)
Journal of Physics. Conference Series, 186(1) 9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, Zürich, Switzerland. DOI: https://doi.org/10.1088/1742-6596/186/1/012032
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Details
- Authors
- Peth, Christian; Barkusky, F.; Sedlmair, J.; Gleber, Sophie-Charlotte ; Nováková, Eva; Niemeyer, J ; Thieme, J.; Salditt, Tim ; Mani, Nivedita ; Mann, K.
- Abstract
- We present a compact setup for near-edge x-ray absorption spectroscopy at the carbon K-edge based on a laser-driven plasma source. Thin polymer films were investigated, showing good agreement with corresponding synchrotron data. Furthermore we have examined the carbon near-edge structure of phospholipids and fulvic acids, providing detailed information on intermolecular binding states.
- Issue Date
- 25-September-2009
- Journal
- Journal of Physics. Conference Series
- Organization
- Institut für Röntgenphysik
- Conference
- 9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY
- Conference Place
- Zürich, Switzerland
- Event start
- 2008-07-21
- Event end
- 2008-07-23
- ISSN
- 1742-6596
- Language
- English
- Subject(s)
- x-ray imaging
