Hard x-ray nanobeam characterization by coherent diffraction microscopy
2010-03-01 | journal article; research paper. A publication with affiliation to the University of Göttingen.
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Hard x-ray nanobeam characterization by coherent diffraction microscopy
Schropp, A.; Boye, P.; Feldkamp, J. M.; Hoppe, R.; Patommel, J.; Samberg, D. & Stephan, S. et al. (2010)
Applied Physics Letters, 96(9) art. 091102. DOI: https://doi.org/10.1063/1.3332591
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Details
- Authors
- Schropp, A.; Boye, P.; Feldkamp, J. M.; Hoppe, R.; Patommel, Jens; Samberg, D.; Stephan, S.; Giewekemeyer, Klaus ; Wilke, Robin N. ; Salditt, Tim ; Gulden, J.; Mancuso, A. P.; Vartanyants, I. A.; Weckert, E.; Schoeder, S.; Burghammer, Manfred; Schroer, C. G.
- Abstract
- We have carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning x-ray microscope. In addition to a high resolution image of the test object, a detailed quantitative picture of the complex wave field in the nanofocus is obtained with high spatial resolution and dynamic range. Both are the result of high statistics due to the large number of diffraction patterns. The method yields a complete description of the focus, is robust against inaccuracies in sample positioning, and requires no particular shape or prior knowledge of the test object.
- Issue Date
- 1-March-2010
- Journal
- Applied Physics Letters
- Organization
- Institut für Röntgenphysik
- Working Group
- RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)
- ISSN
- 0003-6951
- Language
- English
- Subject(s)
- x-ray optics; x-ray imaging
