Annealing of BaTiO3 thin films after heavy ion implantation

2004 | conference paper. A publication with affiliation to the University of Göttingen.

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​Annealing of BaTiO3 thin films after heavy ion implantation​
Dietrich, M.; Buchal, C.; Correia, J. G.; Deicher, M.; Schmid, M.; Uhrmacher, M. & Vetter, U. et al.​ (2004)
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS216 pp. 110​-115. ​8th Conference on Organic Light-Emitting Materials and Devices​, Denver, CO.
Amsterdam​: Elsevier Science Bv. DOI: https://doi.org/10.1016/j.nimb.2003.11.029 

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Authors
Dietrich, Marc; Buchal, C.; Correia, J. G.; Deicher, M.; Schmid, M.; Uhrmacher, Michael; Vetter, Ulrich; Wahl, U.
Abstract
Single crystalline BaTiO3 films have been grown by pulsed laser deposition on SrTiO3. Radioactive I I I in ions were implanted with energies of 60 and 400 keV, respectively. The lattice site of(111) In has been determined by emission channeling of conversion electrons emitted after the nuclear decay to Cd-111. Besides a large random fraction, 11(3)% of the events show that In substitutes Ti-sites directly after the implantation. The recovery of the lattice after the implantation has been monitored in the direct vicinity of the probes by perturbed angular correlation (PAC) spectroscopy in a wide temperature range. After annealing in air at a temperature of 1420 K for 10 min, PAC spectroscopy yields a unique electric field gradient at the site of the In-111(Cd-111)-probe with a quadrupole coupling constant of 28.7(5) MHz and a frequency distribution with a width of 4.2(2) MHz. The film starts to degrade at a temperature of 1520 K. Scanning electron microscopy and energy dispersive X-ray spectroscopy investigations have been used to monitor the degradation. (C) 2003 Elsevier B.V. All rights reserved.
Issue Date
2004
Status
published
Publisher
Elsevier Science Bv
Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 
Conference
8th Conference on Organic Light-Emitting Materials and Devices
Conference Place
Denver, CO
ISSN
1872-9584; 0168-583X

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