Projection phase contrast microscopy with a hard x-ray nanofocused beam: Defocus and contrast transfer
2009-05-29 | journal article; research paper. A publication with affiliation to the University of Göttingen.
Jump to: Cite & Linked | Documents & Media | Details | Version history
Cite this publication
Projection phase contrast microscopy with a hard x-ray nanofocused beam: Defocus and contrast transfer
Salditt, T. ; Giewekemeyer, K. ; Fuhse, C.; Krueger, S. P. ; Tucoulou, R. & Cloetens, P. (2009)
Physical Review B, 79(18) art. 184112. DOI: https://doi.org/10.1103/PhysRevB.79.184112
Documents & Media
Details
- Authors
- Salditt, Tim ; Giewekemeyer, Klaus ; Fuhse, Christian; Krueger, S. P. ; Tucoulou, Remi; Cloetens, Peter
- Abstract
- We report a projection phase contrast microscopy experiment using hard x-ray pink beam undulator radiation focused by an adaptive mirror system to 100-200 nm spot size. This source is used to illuminate a lithographic test pattern with a well-controlled range of spatial frequencies. The oscillatory nature of the contrast transfer function with source-to-sample distance in this holographic imaging scheme is quantified and the validity of the weak phase object approximation is confirmed for the experimental conditions.
- Issue Date
- 29-May-2009
- Journal
- Physical Review B
- Organization
- Institut für Röntgenphysik
- Working Group
- RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)
- ISSN
- 1098-0121
- Language
- English
- Subject(s)
- x-ray optics; x-ray imaging
