Grain rotation and lattice deformation during photoinduced chemical reactions revealed by in situ X-ray nanodiffraction
2015-07-01 | journal article; research paper. A publication with affiliation to the University of Göttingen.
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Grain rotation and lattice deformation during photoinduced chemical reactions revealed by in situ X-ray nanodiffraction
Huang, Z.; Bartels, M. ; Xu, R.; Osterhoff, M. ; Kalbfleisch, S.; Sprung, M. & Suzuki, A. et al. (2015)
Nature Materials, 14(7) pp. 691-695. DOI: https://doi.org/10.1038/nmat4311
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Details
- Authors
- Huang, Zhifeng; Bartels, Matthias ; Xu, Rui; Osterhoff, Markus ; Kalbfleisch, Sebastian; Sprung, Michael; Suzuki, Akihiro; Takahashi, Yukio; Blanton, Thomas N.; Salditt, Tim ; Miao, Jianwei
- Abstract
- In situ X-ray diffraction (XRD) and transmission electron microscopy (TEM) have been used to investigate many physical science phenomena, ranging from phase transitions, chemical reactions and crystal growth to grain boundary dynamics(1-6). A major limitation of in situ XRD and TEM is a compromise that has to be made between spatial and temporal resolution(1-6). Here, we report the development of in situ X-ray nanodiffraction to measure high-resolution diffraction patterns from single grains with up to 5 ms temporal resolution. We observed, for the first time, grain rotation and lattice deformation in chemical reactions induced by X-ray photons: Br- + hv -> Br + e(-) and e(-) + Ag+ -> Ag-0. The grain rotation and lattice deformation associated with the chemical reactions were quantified to be as fast as 3.25 rad s(-1) and as large as 0.5 angstrom, respectively. The ability to measure high-resolution diffraction patterns from individual grains with a temporal resolution of several milliseconds is expected to find broad applications in materials science, physics, chemistry and nanoscience.
- Issue Date
- 1-July-2015
- Journal
- Nature Materials
- Organization
- Institut für Röntgenphysik
- Working Group
- RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)
- ISSN
- 1476-1122
- eISSN
- 1476-4660
- Language
- English
- Subject(s)
- x-ray scattering