Beam tests of silicon pixel 3D-sensors developed at SINTEF

2018 | journal article. A publication with affiliation to the University of Göttingen.

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​Beam tests of silicon pixel 3D-sensors developed at SINTEF​
Dorholt, O.; Hansen, T.; Heggelund, A.; Kok, A.; Pacifico, N.; Rohne, O. & Sandaker, H. et al.​ (2018) 
Journal of Instrumentation13(08) pp. P08020​-P08020​.​ DOI: https://doi.org/10.1088/1748-0221/13/08/P08020 

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Authors
Dorholt, O.; Hansen, T.E.; Heggelund, A.; Kok, A.; Pacifico, N.; Rohne, O.; Sandaker, H.; Stugu, B.; Yang, Z.; Bomben, M.; Rummler, A.; Weingarten, J.
Issue Date
2018
Journal
Journal of Instrumentation 
eISSN
1748-0221

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