Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system
2019-07-01 | journal article; research paper. A publication with affiliation to the University of Göttingen.
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Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system
Osterhoff, M. ; Robisch, A.-L. ; Soltau, J. ; Eckermann, M.; Kalbfleisch, S.; Carbone, D. & Johansson, U. et al. (2019)
Journal of Synchrotron Radiation, 26(4) pp. 1173-1180. DOI: https://doi.org/10.1107/S1600577519003886
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Details
- Authors
- Osterhoff, Markus ; Robisch, Anna-Lena ; Soltau, Jakob ; Eckermann, Marina; Kalbfleisch, Sebastian; Carbone, Dina; Johansson, Ulf; Salditt, Tim
- Abstract
- The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence
- Issue Date
- 1-July-2019
- Journal
- Journal of Synchrotron Radiation
- Organization
- Institut für Röntgenphysik
- Working Group
- RG Salditt (Structure of Biomolecular Assemblies and X-Ray Physics)
- ISSN
- 1600-5775
- ISSN
- 1600-5775
- Language
- English
- Subject(s)
- x-ray optics
