X-ray spectroscopy with variable line spacing based on reflection zone plate optics

2018-09-15 | journal article; research paper. A publication with affiliation to the University of Göttingen.

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​X-ray spectroscopy with variable line spacing based on reflection zone plate optics​
Yin, Z.; Löchel, H.; Rehanek, J.; Goy, C.; Kalinin, A.; Schottelius, A. & Trinter, F. et al.​ (2018) 
Optics Letters43(18) pp. 4390​-4393​.​ DOI: https://doi.org/10.1364/OL.43.004390 

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Authors
Yin, Zhong; Löchel, Heike; Rehanek, Jens; Goy, Claudia; Kalinin, Anton; Schottelius, Alexander; Trinter, Florian; Miedema, Piter; Jain, Avni; Valerio, Joana; Busse, Philipp ; Lehmkühler, Felix; Möller, Johannes; Grübel, Gerhard; Madsen, Anders; Viefhaus, Jens; Grisenti, Robert E.; Beye, Martin; Erko, Alexei; Techert, Simone 
Abstract
X-ray spectroscopy is a method, ideally suited for investigating the electronic structure of matter, which has been enabled by the rapid developments in light sources and instruments. The x-ray fluorescence lines of life-relevant elements such as carbon, nitrogen, and oxygen are located in the soft x-ray regime and call for suitable spectrometer devices. In this Letter, we present a high-resolution spectrum of liquid water, recorded with a soft x-ray spectrometer based on a reflection zone plate (RZP) design. The RZP-based spectrometer with meridional variation of line space density from 2953 to 3757 l/mm offers extremely high detection efficiency and, at the same time, medium energy resolution. We can reproduce the well-known splitting of liquid water in the lone pair regime with 10 s acquisition time.
Issue Date
15-September-2018
Journal
Optics Letters 
Project
SFB 1073: Kontrolle von Energiewandlung auf atomaren Skalen 
SFB 1073 | Topical Area B | B06 Echtzeituntersuchungen der optischen Anregung in oligonuklearen Metallkomplexen mit schaltbaren Spin- und Ladungszuständen 
SFB 1073 | Topical Area C | C02 In situ hochauflösende Untersuchung des aktiven Zustands bei der photo- und elektrochemischen Wasserspaltung 
Organization
Institut für Röntgenphysik 
Working Group
RG Techert (Structural Dynamics in Chemical Systems) 
ISSN
0146-9592; 1539-4794
eISSN
1539-4794
Language
English

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