X-ray diffraction from mesoscopic systems: thin films on 'rough' surfaces
1995 | journal article; research paper
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X-ray diffraction from mesoscopic systems: thin films on 'rough' surfaces
Tolan, M. ; Vacca, G.; Sinha, S. K.; Li, Z.; Rafailovich, M.; Sokolov, J. & Lorenz, H. et al. (1995)
Journal of Physics. D, Applied Physics, 28(4A) pp. A231-A235. DOI: https://doi.org/10.1088/0022-3727/28/4A/045
