X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
2004 | journal article; research paper
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X-ray reflectivity study of the influence of temperature fluctuations on the density profile of thin liquid films
Fendt, R.; Sprung, M.; Gutt, C.; Seeck, O. H. & Tolan, M. (2004)
Zeitschrift für Kristallographie. Crystalline Materials, 219(4) pp. 205-209. DOI: https://doi.org/10.1524/zkri.219.4.205.30446
