Surface Structure of Soft-Matter Thin Films probed by Diffuse X-Ray Scattering
2000 | book part
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Surface Structure of Soft-Matter Thin Films probed by Diffuse X-Ray Scattering
Tolan, M. ; Seeck, O. H.; Wang, J.; Sinha, S. K.; Rafailovich, M. H.& Sokolov, J. (2000)
In:Lam, N. Q.; Melendres, C. A.; Sinha, S. K. (Eds.), Exploration of subsurface phenomena by particle scattering. International Advanced Studies Institute Press.
