Journal of Physics. D, Applied Physics

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  • 2003 Conference Paper
    ​ ​X-ray microscopy in Zernike phase contrast mode at 4 keV photon energy with 60 nm resolution​
    Neuhausler, U.; Schneider, G.; Ludwig, W.-D.; Meyer, M. A.; Zschech, E. & Hambach, D.​ (2003)
    Journal of Physics D Applied Physics36(10A) pp. A79​-A82. ​X-TOP 2002 Conference​, GRENOBLE, FRANCE.
    Bristol​: Iop Publishing Ltd. DOI: https://doi.org/10.1088/0022-3727/36/10A/316 
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