Journal of Physics. D, Applied Physics

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  • 1995 | Journal Article | Research Paper
    ​ ​X-ray diffraction from mesoscopic systems: thin films on 'rough' surfaces​
    Tolan, M. ; Vacca, G.; Sinha, S. K.; Li, Z.; Rafailovich, M.; Sokolov, J. & Lorenz, H. et al.​ (1995) 
    Journal of Physics. D, Applied Physics, 28(4A) pp. A231​-A235​.​ DOI: https://doi.org/10.1088/0022-3727/28/4A/045 
    ​Details  DOI 

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