Journal of Physics. D, Applied Physics

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  • 1999 | Journal Article | Research Paper
    ​ ​Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy​
    Kovats, Z.; Salditt, T. ; Metzger, T. H. ; Peisl, J.; Stimpel, T.; Lorenz, H. & Chu, J. O. et al.​ (1999) 
    Journal of Physics D: Applied Physics, 32(4) pp. 359​-368​.​ DOI: https://doi.org/10.1088/0022-3727/32/4/002 
    ​Details  DOI  WoS 
  • 1995 | Journal Article | Research Paper
    ​ ​Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment​
    Salditt, T. ; Metzger, T. H. ; Peisl, J. & Goerigk, G.​ (1995) 
    Journal of Physics D: Applied Physics, 28(4A) pp. A236​-A240​.​ DOI: https://doi.org/10.1088/0022-3727/28/4A/046 
    ​Details  DOI  WoS 
  • 1995 | Journal Article | Research Paper
    ​ ​X-ray diffraction from mesoscopic systems: thin films on 'rough' surfaces​
    Tolan, M. ; Vacca, G.; Sinha, S. K.; Li, Z.; Rafailovich, M.; Sokolov, J. & Lorenz, H. et al.​ (1995) 
    Journal of Physics. D, Applied Physics, 28(4A) pp. A231​-A235​.​ DOI: https://doi.org/10.1088/0022-3727/28/4A/045 
    ​Details  DOI 

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